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Spectro Analytical Instruments GmbH. (5/17/11). "Press Release: SPECTRO XEPOS HE XRF Instrument Sets a New Standard for the Quantification of Heavy Elements". Kleve.

Organisation Organisation Spectro Analytical Instruments GmbH
  Group AMETEK (Group)
Products Product SPECTRO XEPOS HE X-ray fluorescence analytical instrument
  Product 2 analytical instrument
Persons Person Wissmann, Dirk (Ametek 201105 Product Manager XRF at SPECTRO Analytical Instruments)
  Person 2 Milner, Tom (Ametek 201009 SPECTRO)
     


Optimized excitation and detection guarantee outstanding sensitivity and accuracy for the analysis of metals and heavy metals in a wide range of material


In May 2011 SPECTRO Analytical Instruments will be showing the SPECTRO XEPOS HE X-ray fluorescence analytical instrument for the first time. The new model in the SPECTRO XEPOS series is optimized for the analysis of medium and heavy elements. In this area, it achieves detection limits that are a factor of 5 to 10 times better than conventional ED-XRF instruments. The SPECTRO XEPOS HE - "HE" stands for "Heavy Elements" - has been developed mainly for laboratories in the environmental analysis, geology and waste disposal areas.

"Commonly used XRF instruments are setup for rapid screening analyses and for the quantification of many elements; they often determine the concentrations of heavy elements only in screening quality," explains Dirk Wissmann, Product Manager for XRF at SPECTRO. "But especially heavy elements like cadmium or antimony are of great interest for many applications. This is why we've added the XEPOS HE to our range of products - an instrument that offers all the advantages of modern XRF, but, with its innovative design, is able to reliably quantify even heavy elements in ppm ranges."

The highlight in the SPECTRO XEPOS HE is its flexible excitation source: The instrument uses an extremely stable end-window tube with a power of only 50 Watt. The target changer with up to eight polarization and secondary targets enables users to achieve excellent sensitivity and accuracy for an ED-XRF instrument during the analysis of medium and heavy elements.

Choice between Two Detector Sizes

The SPECTRO XEPOS HE is available in two detector models to ensure seamless integration into laboratory operation: The standard instrument utilizes the newest type of silicon drift detector with a 10 mm² surface. Using internal collimation, it achieves a very good signal to noise ratio and delivers, with its high resolution and high count rate, extremely accurate measurements in the shortest of times. For especially demanding environments, the XEPOS HE can be equipped with an optional, three times larger 30 mm² detector. With the larger surface area it provides much higher sensitivities - and gives laboratories the ability to decide: measure a great deal faster or achieve lower detection limits.

Suited to Many Applications

As a specialist for the heavy metals, the SPECTRO XEPOS HE is suited to a number of application areas that were not, until now, accessible for ED-XRF instruments. This includes:

* Geological examinations: When analyzing rock samples, geological laboratories are dependent on the reliable quantification of heavy elements - documentation of the arsenic or cadmium contamination in soil, for example. Even in this area, the SPECTRO XEPOS HE provides an exact determination of the concentration.

* Compliance Analyses for Environmental Applications: For a long time, the only internationally binding criterion for consumer goods was the maximum content of 100 ppm cadmium as defined in the RoHS. Meanwhile, many government and commercial organizations are defining stricter limiting values, often in the range of 5 ppm. Conformance with these new limiting values cannot be reliably ensured using conventional XRF instruments - the SPECTRO XEPOS HE, however, provides extremely reliable results in this area.

* Analysis of Waste Oil and Alternative Fuel: When burning alternative fuels, cement works must fulfill increasingly strict legal restrictions and they must document conformance with incoming and outgoing samples. Here too, highest values in ppm ranges are frequently valid for heavy elements. In this application area, which is inaccessible to conventional EDXRF, the XEPOS HE delivers outstanding results.


About SPECTRO:

SPECTRO is one of the worldwide leading suppliers of analytical instruments for optical emission and X-ray fluorescence spectrometry. SPECTRO manufactures advanced instruments, develops the best solutions for strongly varying applications and provides exemplary customer service. SPECTRO's products are exemplified by unique technical capabilities that deliver measureable benefits to the customer. From its foundation in 1979 until today, more than 30,000 analytical instruments have been delivered to customers around the world.

AMETEK, Inc. is a leading global manufacturer of electronic instruments and electric motors with an annual turnover of approximately 2.5 billion US$. AMETEK's corporate growth plan is based on four key strategies: Operative excellence, strategic acquisitions and alliances, geographic and market expansion as well as new products. AMETEK's common stock is a component of the S&P MidCap 400 Index and the Russell 1000 Index.


Please contact Tom Milner for additional information, Tel: +49.2821.892-0, Fax: +49.2821.892-2200, E-Mail: spectro.info@ametek.com

   
Record changed: 2016-03-20

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