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Patricia Corkum (JEOL USA Inc.)

Corkum, Patricia (JEOL 200903 Marketing Manager JEOL USA)


Organisation Organisation JEOL USA Inc.
  Group JEOL (Group)
Product Product mass spectrometry (MS)

JEOL USA, Inc.. (3/6/09). "Press Release: JEOL Introduces Highest Sensitivity GC-TOF Mass Spectrometer". Peabody, MA.

The new AccuTOF-GCv from JEOL features the highest sensitivity of any GC time-of-flight mass spectrometer commercially available. By combining rapid data acquisition speeds with high resolution and a high dynamic range, the AccuTOF-GCv delivers exact mass measurements for both qualitative and quantitative analysis.

The new AccuTOF-GCv introduces several new software features including automatic ion source tuning, automatic drift calibration, automatic data file conversion and export. The Tuning Assistant function optimizes ion source parameters for peak ion intensity and resolution.

In addition to the standard EI source and optional CI source, a new optional EI/FI/FD combination ion source eliminates the need to exchange ion sources to switch between electron impact and field ionization or field desorption ionization, resulting in higher sample throughput, easier operation and longer uptime. The combination EI/FI/FD source also enables GC-FI operation that can be used to characterize samples that are difficult for traditional GC-EI or GC-CI measurements. The AccuTOF-GCv aids qualitative analysis using the mass spectra library search, polymer analysis, and hydrocarbon analysis. An optional comprehensive 2D GCxGC measurement attachment is available.

The high sensitivity (S/N = 100 at OFN 1 pg/µL) of the AccuTOF-GCv allows for rapid exact mass and target compound identification and quantitation in trace analyses. The AccuTOF-GCv combines high-speed acquisition of 25 averaged spectra per second with high mass resolving power of 6000 FWHM and mass accuracy of 5 ppm -- plus it provides the highest linear dynamic range for improved analysis of both low and high concentrations.

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JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S. For more information about JEOL USA, Inc. or any JEOL products, visit, or call 978-535-5900.

Record changed: 2016-08-03


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