DART™ ion source (Direct Analysis in Real Time ion source)

	Next higher product group	ion source
	Status	2005-02-28 sales start
	Organisation	JEOL (Group)

JEOL USA, Inc.. (2/28/05). "Press Release: JEOL Demonstrates new DART for Mass Analysis at Pittcon ’05". Orlando, FL.

JEOL USA will unveil revolutionary technology today for analyzing the chemical composition of solids, gases, and liquids in open air. At Pittcon 2005, the premier conference and exhibition devoted to laboratory science, JEOL (booth #1676/1776) will demonstrate its unique DARTTM (Direct Analysis in Real Time) ion source for the AccuTOFTM mass spectrometer, using the instrument to analyze everyday items such as currency and clothing to instantly detect the presence of illicit drugs or explosives. During the demonstration, the DART will identify, in real time, the chemical makeup of spices, biological samples, pharmaceuticals, food, and more. The resulting chromatograms showing qualitative and quantitative information about the sample composition and concentrations will display on a large plasma screen in the booth.

JEOL will hold a press conference introducing DART on Monday, February 28, 2005, from 8:30 to 9:30 a.m., room N220G in the Orange County Convention Center.

Eliminates Sample Prep

The DART eliminates the need for sample preparation and, as a result, the need to use either gas or liquid chromatography. Without the use of solvents, radiation, or vacuum, the DART liberates laboratory analysis by eliminating the time it takes to prepare samples, the need for chemicals and their disposal, and the need to maintain and clean plumbing.
Instant Identification

DART preserves the integrity of the sample and provides real-time information, critical for screening or high throughput analyses during forensics investigations, homeland security operations, and toxicological examinations. The DART with AccuTOF uses no harmful chemicals, radiation, or lasers.

Proven Technology

The DART ion source, when installed on the JEOL AccuTOF time-of-flight mass spectrometer, provides improved selectivity and accurate elemental composition assignment through exact mass measurements. During its development and subsequent beta site testing at the Edgewood Chemical Biological Center located at the U.S. Army Aberdeen Proving Grounds in Maryland, DART successfully sampled hundreds of chemicals, including chemical agents and their signatures, pharmaceutics, metabolites, peptides and oligosaccharides, synthetic organics, organometallics, drugs of abuse, explosives, and toxic industrial chemicals. These chemicals were detected on a variety of surfaces.

The DART is based on the reactions of excited-state species with reagent molecules and polar or non-polar analytes and is free of the limitations of other atmospheric pressure ion sources, which require direct exposure of gaseous or vaporized liquid samples to elevated temperatures and electrical potentials, ultraviolet irradiation, laser radiation, or a high-velocity gas stream.

DART Demonstrations at Pittcon

JEOL will demonstrate the DART ion source throughout the week of the Pittcon tradeshow, February 28th to March 3rd. JEOL is a global supplier of analytical instruments, including the family of AccuTOF time-of-flight mass spectrometers, small bench top double-focusing magnetic sector mass spectrometers, and larger tandem and hybrid mass spectrometers. JEOL offers high performance research NMR and routine NMR systems with advanced software automation, multiple probes, and auto sample changers. The company will also be demonstrating one of its high performance scanning electron microscopes (SEM) in the booth.

Nitroglycerin detected on an employee's tie after exposure to a plume from blasting. Methylene chloride vapor was placed beneath the DART to enhance the formation of [M+Cl]-. All elemental compositions were easily confirmed by exact mass measurements.

Record changed: 2012-03-09

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DART™ ion source (Direct Analysis in Real Time ion source)

JEOL USA, Inc.. (2/28/05). "Press Release: JEOL Demonstrates new DART for Mass Analysis at Pittcon ’05". Orlando, FL.

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