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JEOL Ltd.. (5/20/10). "Press Release: JMS-S3000 – MALDI-TOF (Matrix-Assisted LAser Desorption/Ionization Time of Flight) Mass Spectrometer. Incorporating a New Spiral TOF Ion Optic System Capable of High Resolution Mass Analysis Over a Wide Molecular Wei

Organisation Organisation JEOL Ltd. (JP)
  Group JEOL (Group)
Products Product JMS-S3000 SpiralTOF™ mass spectrometer
  Product 2 MALDI-TOF mass spectrometry technology
Person Person Kurihara, Gon-emon (JEOL 201108 President)
     


JEOL Ltd. (Gon'emon Kurihara, President) announced a new spiral MALDI-TOF mass spectrometer, JMS-S3000, to be distributed in May 2010.

The JMS-S3000 is a MALDI-TOF MS incorporating JEOL's original spiral TOF ion optic system. Featuring unprecedented levels of mass resolution and sensitivity, the system has been acknowledged for its distinctive capabilities in many scientific studies.
The JMS-S3000 is a leading analytical tool, suitable for changing research needs in areas of synthetic polymers, material science, and biological polymers.

[ Features ]

1. High mass resolution and sensitivity over a wide mass range

Since many of synthetic polymers have varied molecular weight distributions, analysis of such samples requires high mass resolution and sensitivity in a wide molecular weight range. The JMS-S3000, incorporating JEOL's unique Spiral TOF ion optic system, is superior to others in these areas.

2. Optional linear TOF

This is effective for measurement of high molecular weight ions and analysis of samples subject to self-fragmentation.

3. Optional TOF/TOF

This configuration enables MS/MS analysis by high energy collision-induced dissociation. The system, featuring a high precursor ion selection capability, allows the operator to select and monitor only monoisotopic ions in product ion spectral data. It is especially effective for analysis of complex product ion spectra.

[ Specifications ]

Resolution 60,000 (ACTH fragment 1-17 [M+H]+: m/z 2093.1)
Mass resolution (internal reference) 1 ppm (average error)
Mass accuracy (external reference) 10 ppm (average error)
Sensitivity 500 amol, S/N > 50 with standard stainless steel plate
Laser Wavelength 349 nm (maximum 250 Hz)

# # #

JEOL Ltd.

JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com, or call +81-42-543-1111.

   
Record changed: 2019-06-09

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