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Document › Details

JEOL Ltd.. (8/6/15). "Press Release: Release of New Benchtop SEM JCM-6000Plus NeoScope".

Organisation Organisation JEOL Ltd. (JP)
  Group JEOL (Group)
Product Product JCM-6000Plus NeoScope™
Person Person Kurihara, Gon-emon (JEOL 201108 President)
     


- Equipped with high-sensitivity semiconductor detector, delivering efficient analysis -


JEOL Ltd. (President Gon-emon Kurihara) has developed a new benchtop scanning electron microscope, JCM-6000Plus NeoScope™, designed to fulfill the diversifying needs of customers and expansion of the market. Sale of the new model will start in August 2015.


Product development background

Scanning electron microscopes are being utilized in an expanding range of fields, such as medicine, biology, nanotechnology, metals, semiconductors, and ceramics. In addition, the applications cover a wide spectrum, from basic research to quality control at the manufacturing site.

The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.


Main Features

> Touch panel allowing easy operation, and a full complement of automated functions.
> Allows observation of secondary electron images under high vacuum conditions.
> Improved image quality of backscattered electron images.
> A wealth of optional functions available, such as element analysis.
> Sleek exterior design with a compact footprint.


Main Specifications

Magnification x10 to x60,000

Imaging modes High-vacuum/ Secondary electron image, Backscattered electron image (composition, topography, shadow),
Low-vacuum/ Backscattered electron image (composition, topography, shadow)

Accelerating voltage 5kV/10kV/15kV (3 stages)

Electron gun Small gun with integrated filament / Wehnelt

Specimen stage Manual control, 2-axis stage

Movement range X:35mm Y:35mm

Maximum specimen size 70mm diameter

Maximum specimen height 50mm

Automated functions Full-auto, Auto-focus, Auto-stigma, Auto-contrast & brightness,
Auto gun alignment

Operation Via touch panel and mouse operation

Digital image display 1280×1024 pixels
Options EDS, Tilt/rotation motorized holder, 2-axis motorized stage



JCM-6000Plus


Annual unit sales target
200 units/ year (initial year)


JEOL Ltd.

JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com.

   
Record changed: 2019-06-09

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