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JEOL Ltd.. (9/13/13). "Press Release: Release of the New Scanning Electron Microscope JSM-IT 300 Series".

	Organisation	JEOL Ltd. (JP)
	Group	JEOL (Group)
	Product	JSM-IT 300 Series Scanning Electron Microscope
	Product 2	microscopy
	Person	Kurihara, Gon-emon (JEOL 201108 President)

JEOL Ltd. (President Gon-emon Kurihara) is pleased to announce the development and start of sales of the new Scanning Electron Microscope JSM-IT300 series.

The Scanning Electron Microscope (SEM) is an essential tool in a broad range of applications, from research departments to on-site manufacturing locations, and is used for basic research, material developments, material testing/ assessment/ defect analysis, quality assurance, and analytic tests.

The JSM-IT300 series is a high-performance, multi-purpose SEM capable of handling a variety of applications. These instruments feature a newly-designed user interface that permits operations to be performed via a touch panel, further enhancing the ease-of-use, in addition to debuting a sleek new exterior design.

Main Features

> New electron-optical system offers high quality images for observation

> Applications expanded as a result of an improved low-vacuum observation function

> Multi-purpose chamber with the 5-axis motor-driven stage mounted in the standard configuration

> Various types of analyzers can be mounted simultaneously, and the opposing-type EDS can also be installed.

> Operability is further enhanced by the newly-designed user interface with support for touch screen operation

> Sophisticated design with the look and feel expected of high-performance instrument

Main Specifications
Resolution HV mode: 3.0nm
LV mode: 4.0nm
Magnification ×5~×300,000
Accelerating voltage 0.3kV to 30kV
Specimen stage 5-axis motor stage
X: 125mm Y:100mm Z:5 to 80mm
T:-10 to 90° R:360°
Maximum sample diameter 200mmf
Options EDS, WDS, EBSD etc.

Initial annual unit sales target
200 units/ year

JEOL Ltd.

JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com.

Record changed: 2019-06-09

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JEOL Ltd.. (9/13/13). "Press Release: Release of the New Scanning Electron Microscope JSM-IT 300 Series".

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