Advertisement

Document › Details
JEOL USA, Inc.. (3/7/16). "Press Release: JEOL Tungsten SEM with Smart Analytical Port Geometry Demonstrated at Pittcon 2016". Atlanta, GA.
![]() |
Region | Atlanta, GA |
Country | United States (USA) | |
![]() |
Organisation | JEOL USA Inc. |
Group | JEOL (Group) | |
Organisation 2 | Pittcon (The Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy Inc.) | |
![]() |
Product | JSM-IT 300 Series Scanning Electron Microscope |
Product 2 | Pittcon 2016 Atlanta | |
![]() |
Person | Corkum, Patricia (JEOL 200903 Marketing Manager JEOL USA) |
JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A highly-customizable SEM, the JSM-IT300LV features smart analytical port geometry for multiple configurations allowing simultaneous analysis techniques. It can be outfitted for 10 or more analytical attachments including: energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), cathodoluminescence detectors (CL), wavelength dispersive X-ray spectrometer (WDS), chamberscopes, and heating/cooling sub-stages.
The JSM-IT300LV is designed for a multitude of samples types with a wide range of accelerating voltages from 300v-30kV, a vacuum pressure range of 10-650 Pa, and magnification range of 5-300,000X. The sample chamber accommodates large samples up to 300mm in diameter and 80mm in height without alteration. The unique in-chamber stage ensures accurate sample position even for non-uniform shapes and sizes. The mechanically eucentric 5-axis motorized stage with fast asynchronous movement allows imaging and analysis at a wide range of angles and orientations with pinpoint accuracy.
JEOL SEM software makes operation intuitive and fast across the full spectrum of analytical applications. The IT300LV is part of JEOL's InTouchScope line, with interface via a multi-touch screen as well as traditional keyboard/mouse.
# # #
JEOL USA, Inc.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962. The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.
For more information about JEOL USA, Inc. or any JEOL products, visit www.jeolusa.com, or call 978-535-5900.
CONTACT:
Patricia Corkum, Marketing Manager
978-536-2273 • pcorkum@jeol.com • www.jeolusa.com
Record changed: 2019-04-26 |
Advertisement
![Picture [LSA] Life-Sciences-Asia.com – The Business Web Portal 650x89px](/banner/iito-20190621-650-089-life-sciences-asia.jpg)
More documents for JEOL (Group)
- [1] JEOL Ltd.. (9/7/16). "Press Release: Release of the New Scanning Electron Microscope JSM-IT300HR InTouchScope"....
- [2] JEOL USA, Inc.. (6/2/16). "Press Release: JEOL Highlights New Analytical Technologies at ASMS 2016". Peabody, MA....
- [3] JEOL USA, Inc.. (3/7/16). "Press Release: New PhotoIonization (PI) Source and a new Application for JEOL’s Fourth-Generation AccuTOF-GCX High-Resolution GC/Time-of-Flight Mass Spectrometer". Atlanta, GA....
- [4] JEOL USA, Inc.. (3/7/16). "Press Release: JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis". Atlanta, GA....
- [5] JEOL USA, Inc.. (3/7/16). "Press Release: Powerful Problem-solving Mass Spectrometer Demonstrations at Pittcon 2016 – JEOL AccuTOF-DART 4G". Atlanta, GA....
- [6] JEOL USA, Inc.. (3/7/16). "Press Release: JEOL Demonstrates New Analytical Technology at Pittcon 2016". Atlanta, GA....
- [7] JEOL USA, Inc.. (3/7/16). "Press Release: Big Picture Plus Analysis from a Small, Compact, and Versatile Benchtop SEM – the JSM-6000PLUS NeoScope from JEOL". Atlanta, GA....
- [8] JEOL USA, Inc.. (2/22/16). "Press Release: Researchers First to Prove ZIKA Virus Associated with Microcephaly Used JEOL Transmission Electron Microscopes (TEM) for Imaging Brain Sections"....
- [9] JEOL USA, Inc.. (2/3/16). "Press Release: New JEOL »F2« Versatile S/TEM Offers Advanced Analytical Features". Peabody, MA....
- [10] JEOL Ltd.. (1/4/16). "Press Release: Release of JEM-F200, a Multi-purpose Transmission Electron Microscope"....
To subscribe to our free, monthly mass spectrometry newsletter, please send an e-mail to info@iito.de and simply fill the subject line with the word »MSC Newsletter«
To get even more information, please take a look at our [gs] professional services offering and read the gene-sensor Product Flyer [PDF file]
Please visit also our web portals for the Eurpean life sciences and the life sciences in German-speaking Europe (DE, AT & CH) at Life-Sciences-Germany.com and Life-Sciences-Europe.com
Advertisement

» top